Digital Circuit Testing

Digital Circuit Testing

4.11 - 1251 ratings - Source

Recent technological advances have created a testing crisis in the electronics industry--smaller, more highly integrated electronic circuits and new packaging techniques make it increasingly difficult to physically access test nodes. New testing methods are needed for the next generation of electronic equipment and a great deal of emphasis is being placed on the development of these methods. Some of the techniques now becoming popular include design for testability (DFT), built-in self-test (BIST), and automatic test vector generation (ATVG). This book will provide a practical introduction to these and other testing techniques. For each technique introduced, the author provides real-world examples so the reader can achieve a working knowledge of how to choose and apply these increasingly important testing methods.Morrin, Thomas I-I., Mixed-moded simulation for time-domain fault analysis, Proceedings of 1989 International Test Conference, August 1989. 7. ... Turner, Richard L., and Paul Neudorfer, a€œAutomated Testing, A Course Based on IEEE- 488 Equipment. ... Technical staff of Integrated Measurement Systems, Inc., a€œIMS Mixed Signal System Specification, a€ Integrated Measurement ... Ramaswamy, B., and P. Feder, Test strategy for a 32-bit microprocessor module with memory management, anbsp;...

Title:Digital Circuit Testing
Author:Francis C. Wong
Publisher:Elsevier - 2012-12-02


You Must CONTINUE and create a free account to access unlimited downloads & streaming