Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.dynamic focusing, applying a focus ramp as the scanned image is acquired maximising depth of focus. Table 1. Comparison of parameters from manual and automatic acquisition schemes, for acquisitions from an MCM-41 based catalyst.
|Title||:||Electron Microscopy and Analysis 2003|
|Author||:||S McVitie, D McComb|
|Publisher||:||CRC Press - 2004-02-19|