13-26, 1985.  F.J. Ferguson and J.P. Shen, aquot;A CMOS fault extractor for inductive fault analysisaquot;, IEEE Trans. ...  A.P. Dorey, B.K. Jones, A.M. Richardson, P.C. Russell, Y.Z. Xu, aquot;Reliability testing by precise electrical measurementaquot;, IEEE Proc. ... Report and usera#39;s manualaquot; , Eindhoven University of Technology, Department of Electrical Engineering, The ... Maxwell, R.C. Aitken, V . Johansen and I. Chiang, aquot;The effect of different test sets on quality level prediction: when is 80% betteranbsp;...
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