Exploiting Regularity for Defect-based Test

Exploiting Regularity for Defect-based Test

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We propose DSI strategies that exploit physical regularity to improve efficiency. By calculating critical area for only a small section of a VPGA layout, computation is significantly reduced. Moreover, by representing a logic-brick layout using a bitmap representation, DSI is performed in linear time with the size of the brick. Since computation time is significantly reduced, comprehensive DSI is performed for bridges and opens for both VPGA and logic-brick designs.6.2 Future Work The work described in this thesis involved several interesting areas of DBT that require further investigation. ... However, the regularity inherent to the FEOL may induce regularity at the BEOL, which can then be exploited for DSI. ... The results we showed for logic-brick interactions provide valuable information for making informed decisions regarding the placement of logic bricks .

Title:Exploiting Regularity for Defect-based Test
Author:Jason G. Brown
Publisher:ProQuest - 2009


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