With the growing proliferation of nanotechnologies, powerful imaging technologies are being developed to operate at the sub-nanometer scale. The newest edition of a bestseller, the Handbook of Charged Particle Optics, Second Edition provides essential background information for the design and operation of high resolution focused probe instruments. The bookas unique approach covers both the theoretical and practical knowledge of high resolution probe forming instruments. The second edition features new chapters on aberration correction and applications of gas phase field ionization sources. With the inclusion of additional references to past and present work in the field, this second edition offers perfectly calibrated coverage of the fieldas cutting-edge technologies with added insight into how they work. Written by the leading research scientists, the second edition of the Handbook of Charged Particle Optics is a complete guide to understanding, designing, and using high resolution probe instrumentation.The last attempt to produce an electrostatic transmission microscope was by Elektros Corporation in the United States (Rempfer et al., 1972). ... This microscope uses a miniature magnetic lens, excited by cobalt-samarium permanent magnets, that fulfills the role of condenser ... reviews of the relevant instrumental problems are given by Veneklasen (1992) and Bauer (1994), most recently by Bauer (2007)anbsp;...
|Title||:||Handbook of Charged Particle Optics, Second Edition|
|Publisher||:||CRC Press - 2008-10-24|