This book provides readers with a variety of tools to address the challenges posed by hot carrier degradation, one of todayas most complicated reliability issues in semiconductor devices. Coverage includes an explanation of carrier transport within devices and book-keeping of how they acquire energy (abecome hota), interaction of an ensemble of colder and hotter carriers with defect precursors, which eventually leads to the creation of a defect, and a description of how these defects interact with the device, degrading its performance.59(13), 1623a1625 (1991) 8.2_Tyaginov Taurus Medici User Guide (2007) ed. ... 55(9), 2287a2296 (2008) G. Eneman, B. De Jaeger, E. Simoen, D.P. Brunco, G. Hellings, J. Mitard, K. De Meyer, M. Meuris, M. Heyns, Quantification of ... 32(2), 375a385 (1985). doi:10.1109/T-ED.1985.21952 Sentaurus Process Reference Manual (2006), ed. X-2006.06 Channel Hot Carrier Degradation and Self- Heating Effects in FinFETs Moonju Channel Hot Carriers in SiGe and Ge pMOSFETs 285.
|Title||:||Hot Carrier Degradation in Semiconductor Devices|
|Publisher||:||Springer - 2014-10-29|