Microscopy of Semiconducting Materials 2003

Microscopy of Semiconducting Materials 2003

4.11 - 1251 ratings - Source

Modern electronic devices rely on ever-greater miniaturization of components, and semiconductor processing is approaching the domain of nanotechnology. Studies of devices in this regime can only be carried out with the most advanced forms of microscopy. Accordingly, Microscopy of Semiconducting Materials focuses on international developments in semiconductor studies carried out by all forms of microscopy. It provides an overview of the latest instrumentation, analysis techniques, and state-of-the-art advances in semiconducting materials science for solid state physicists, chemists, and material scientists.... since there are also indications for the existence of Burgers vectors with the aquot; wrongaquot; sign (Dixon and Goodhew 1990, ... Burgers vectors are defined according to the FS/RH convention for the Burgers circuit (Hirth and Lothe 1982). b) The ... The value of n corresponds to the number of intensity maxima of the splitting regime. ... Possible combinations and resulting values for n are shown in the drawing.

Title:Microscopy of Semiconducting Materials 2003
Author:A.G Cullis, P.A. Midgley
Publisher:CRC Press - 2004-04-20


You Must CONTINUE and create a free account to access unlimited downloads & streaming