J. F. Klem, aquot; W. G. Breiland, I. J. Fritz, T. J. Drummond, and S. R. Lee Sandia National Laboratories, P.O. Box 5800, Albuquerque, New Mexico 87.185 ( Received 5 October 1997; accepted 12 December 1997) We have used normal- incidence reflectance to monitor the growth of molecular beam ... 1998 American Vacuum Society. ... EXPERIMENT A schematic of the reflectance system is shown in Fig. 1.
|Title||:||Papers from the 16th North American Conference on Molecular Beam Epitaxy|
|Author||:||Keith R. Evans|