Repair is implemented by deletion of either rows and/or columns on which faulty cells lie. These devices are commonly referred as redundant memories, because columns and rows are added as spares. Existing repair approaches areanbsp;...
|Title||:||Testing and Diagnosis of VLSI and ULSI|
|Author||:||Fabrizio Lombardi, Mariagiovanna Sami, North Atlantic Treaty Organization. Scientific Affairs Division|
|Publisher||:||Springer Science & Business Media - 1988|