High-resolution x-ray diffraction and scattering is a key tool for structure analysis not only in bulk materials but also at surfaces and buried interfaces from the sub-nanometer range to micrometers. This book offers an overview of diffraction and scattering methods currently available at modern synchrotron sources and illustrates bulk and interface investigations of solid and liquid matter with up-to-date research examples. It presents important characteristics of the sources, experimental set-up, and new detector developments. The book also considers future exploitation of x-ray free electron lasers for diffraction applications.(b) Normalized variance of the instantaneous correlations as a function of delay time for waiting times td = 1, 400 s ... 13.7.6 Local Bond Order in Colloidal Glasses Disordered matter, such as glasses and liquids, does not exhibit ... This mysterious and so far experimentally inaccessible localized order within disorder has been fascinating scientists for many decades, ... Our experimental and theoretical approach to solve this ageold problem has followed the guiding principle that first theanbsp;...
|Author||:||Oliver H. Seeck, Bridget Murphy|
|Publisher||:||CRC Press - 2015-02-10|